Beilstein J. Nanotechnol.2020,11, 740–769, doi:10.3762/bjnano.11.61
[112] and is thus a candidate for a spin qubit. Other modeling based on DFT and constrained DFT attributes the SPE to a VNCB defect [104].
In [97] few layers of exfoliated h-BN were studied under cathode-luminescence (CL) combined with a Hanbury Brown and Twiss interferometer to identify their SPE in
on PL in h-BN. Very likely, this spreading of shapes and positions possibly originates from the many relevant parameters that are not fully under control in the preparation of the material and the way the experiments are conducted.
In the first experiments, ensemble measurements using cathode
-luminescence and optical spectroscopy in deep ultraviolet [91][93][94] were used for the characterization of stacking faults and point defects.
More recently an aberration-corrected high-resolution transmission electron microscopy technique has been used to resolve atomic defects in a freestanding single layer
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Figure 1:
(a) Schematic representation of spontaneous emission from a non-resonantly driven 2-level system. (...
Beilstein J. Nanotechnol.2017,8, 1939–1945, doi:10.3762/bjnano.8.194
(LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathodeluminescence (CL) measurements. The results show that ZnO grown on planar Si(100), planar Si(111), and textured Si(100) substrates favor the growth of ZnO(110) ridge-like, ZnO
.
Keywords: atomic force microscopy; cathodeluminescence; scanning electron microscopy; silicon solar cells; transparent conducting oxide; X-ray diffraction; ZnO; Introduction
Transparent conductive oxides (TCOs), with both high electrical conductivity and optical transparency, could be used as a
by LPCVD. These three samples are characterized and analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathodeluminescence (CL) measurements. The grain structure, average grain size, and associated strains are shown to agree well with the
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Figure 1:
(a) XRD and (b) grain percentages obtained from integration of the intensity of the XRD peaks of th...